发明名称 SPHERICAL ABERRATION CORRECTION ELECTROSTATIC LENS, INPUT LENS, ELECTRON SPECTROSCOPIC DEVICE, PHOTOELECTRON MICROSCOPE, AND MEASUREMENT SYSTEM
摘要 A mesh (M) having an ellipsoid shape or a shape close to the ellipsoid shape is attached to an electrode (EL1) among electrodes (EL1 to ELn). Voltages of the later-stage electrodes (EL2 to ELn) are appropriately set. With this arrangement, a local negative spherical aberration generated by the mesh (M) is cancelled out with a positive spherical aberration. This optimizes an electric field distribution. As a result, this realizes an electrostatic lens whose acceptance angle is extended to about ±60°.
申请公布号 EP1793410(A4) 申请公布日期 2009.10.21
申请号 EP20040822204 申请日期 2004.11.09
申请人 NATIONAL UNIVERSITY CORPORATION NARA INSTITUTE OFSCIENCE AND TECHNOLOGY;JEOL LTD. 发明人 DAIMON, HIROSHI;MATSUDA, HIROYUKI;KATO, MAKOTO;KUDO, MASATO
分类号 H01J37/244;G01N23/227;H01J37/12;H01J37/285 主分类号 H01J37/244
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