发明名称 Method for fabricating semiconductor device
摘要 A method for fabricating a semiconductor device is provided. The method includes: loading a wafer into a chamber including a ceramic dome coated with a material having etch tolerance against a plasma; etching a gate structure formed on the wafer, thereby generating etch remnants; and removing the etch remnants by using a gas of SF6 as a main etch gas.
申请公布号 US7604750(B2) 申请公布日期 2009.10.20
申请号 US20050282810 申请日期 2005.11.18
申请人 MAGNACHIP SEMICONDUCTOR, LTD. 发明人 SHIN KYOUNG-CHOUL;MUN SEONG-YEOL
分类号 H01L21/302 主分类号 H01L21/302
代理机构 代理人
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