发明名称 Nonvolatile memory devices
摘要 Methods of fabricating nonvolatile memory devices are provided. An isolation layer is formed on a substrate. The substrate has a memory region and a well contact region and the isolation layer defines an active region of the substrate. A gate insulating layer is formed on the active region. The gate insulating layer is patterned to define an opening therein. The opening exposes at least a portion of the well contact region of the substrate and acts as a charge pathway for charges generated during a subsequent etch of the isolation layer. Related memory device are also provided.
申请公布号 US7605473(B2) 申请公布日期 2009.10.20
申请号 US20060403964 申请日期 2006.04.13
申请人 SAMSUNG ELECTRONICS CO., LTD. 发明人 CHOI JUNG-DAL;SHIN YUN-SEUNG;SEL JONG-SUN
分类号 H01L21/336 主分类号 H01L21/336
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