| 摘要 |
PURPOSE: A PCB sample for quantitatively and objectively performing quality evaluation of a PCB is provided to easily perform reliability evaluation of a PCB by including various evaluation regions. CONSTITUTION: In thermal shock durability test region(210), a plurality of via holes of a via hole sample are successively short-circuited. In a hole to hole high temperature high humidity durability test region(220), via holes of an odd-numbered vertical line among the via holes of the via hole sample are short-circuited, and are connected to a first terminal. Via holes of an even-numbered vertical line are short-circuited, and are connected to a second terminal. In a line to line high temperature high humidity durability test region(230), an odd-numbered line among a plurality of lines of a line sample is connected to a third terminal and an even-numbered line is connected to a fourth terminal.
|
