发明名称 Metal-insulator-metal capacitor and method for fabricating the same
摘要 A metal-insulator-metal (MIM) capacitor that includes a silicon nitride (SiN) dielectric film is disclosed. The MIM capacitor includes a bottom electrode, a top electrode and a dielectric layer positioned between the bottom electrode and the top electrode. The dielectric layer includes a silicon nitride film that has a plurality of silicon-hydrogen bonds and a plurality of nitride-hydrogen bonds. A ratio of silicon-hydrogen bonds to nitride-hydrogen bonds is equal to or smaller than 0.5. Accordingly, the nitrogen-rich and compressive silicon nitride film can improve the breakdown voltage of the MIM capacitor.
申请公布号 US7606021(B2) 申请公布日期 2009.10.20
申请号 US20070678628 申请日期 2007.02.26
申请人 UNITED MICROELECTRONICS CORP. 发明人 SHIH LIAN-HUA;WU YI-CHING;CHEN JIANN-FU;CHEN MING-TE;CHENG CHIN-JEN
分类号 H01G4/06 主分类号 H01G4/06
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