发明名称 Semiconductor memory device controlling output voltage level of high voltage generator according to temperature variation
摘要 A semiconductor memory device controlling an output voltage level of a high voltage generator in response to a variation of temperature has a high voltage generator that provides a high voltage higher than a power source voltage through an output terminal, generates a temperature detection signal obtained by sensing a variation of a diode current based on a temperature variation, and adjusts a voltage level of the output terminal in response to the temperature detection signal. The device is able to automatically control an output voltage or current of the high voltage generator.
申请公布号 US7606099(B2) 申请公布日期 2009.10.20
申请号 US20070621251 申请日期 2007.01.09
申请人 SAMSUNG ELECTRONICS CO., LTD. 发明人 CHUNG HWI-TAEK
分类号 G11C7/00 主分类号 G11C7/00
代理机构 代理人
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