发明名称 SUBSTRATE INSPECTION DEVICE
摘要 <P>PROBLEM TO BE SOLVED: To provide a substrate inspection device having an inexpensive and simple constitution using a floating stage. Ž<P>SOLUTION: The substrate inspection device is equipped with: the floating stage 2 for floating a substrate (10) to be inspected to support the same; a light source positioned above the floating stage 2 to emit dark field illumination light to the substrate (10) to be inspected; a scattering/reflecting part 2a positioned above the floating stage 2 to scatter and reflect the dark-field illumination light; and an optical system (3) for performing the vertical illumination dark-field observation of the substrate (10) to be inspected. Ž<P>COPYRIGHT: (C)2010,JPO&INPIT Ž
申请公布号 JP2009236732(A) 申请公布日期 2009.10.15
申请号 JP20080084163 申请日期 2008.03.27
申请人 OLYMPUS CORP 发明人 HASEGAWA TOMOAKI
分类号 G01N21/956;G02F1/13 主分类号 G01N21/956
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