发明名称 SEMICONDUCTOR DEVICE AND MANUFACTURING METHOD THEREFOR
摘要 PROBLEM TO BE SOLVED: To provide a resistive element where the temperature coefficient and sheet resistance value can be adjusted independently. SOLUTION: By forming a first polycrystalline semiconductor film 3 on a semiconductor substrate 1 and ion-implanting an inert element in a region to the middle of a film thickness from the surface, the region is changed into an amorphous semiconductor film 3A. Then, by ion-implanting carrier impurities into the amorphous semiconductor film 3A and then performing heat treatment, the amorphous semiconductor film 3A is polycrystallized, thus forming a second polycrystalline semiconductor film 4. As a result, the average grain size of the second polycrystalline semiconductor film 4 is increased, as compared with that of the first polycrystalline semiconductor film 3. COPYRIGHT: (C)2010,JPO&INPIT
申请公布号 JP2009239068(A) 申请公布日期 2009.10.15
申请号 JP20080083979 申请日期 2008.03.27
申请人 SANYO ELECTRIC CO LTD;SANYO SEMICONDUCTOR CO LTD 发明人 FUKUDA MIKIO
分类号 H01L21/822;H01L21/20;H01L21/265;H01L27/04 主分类号 H01L21/822
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