Method for Improving the Reliability of Low-k Dielectric Materials

摘要

A method for forming an integrated circuit structure includes providing a semiconductor substrate; forming a low-k dielectric layer over the semiconductor substrate; generating hydrogen radicals using a remote plasma method; performing a first hydrogen radical treatment to the low-k dielectric layer using the hydrogen radicals; forming an opening in the low-k dielectric layer; filling the opening with a conductive material; and performing a planarization to remove excess conductive material on the low-k dielectric layer.