发明名称 TESTING METHOD OF MAGNETIC HEAD BY USING INDUCTANCE
摘要 It is an object of the present invention to provide a method for investigating magnetic domains, the method capable of easily grasping behavior of the magnetic domains in a head manufacturing process, and further to provide a testing method of a magnetic head capable of evaluating whether the writing performance of the magnetic head is good or not. The method for investigating magnetic domains comprises supplying direct current (DC) to a coil of an electromagnetic transducer provided in a magnetic head for writing data onto a magnetic recording medium; measuring an inductance of the electromagnetic transducer at each current value while varying the current value of the direct current; and investigating behavior of magnetic domains in a magnetic core of the electromagnetic transducer based on a relationship between the current values and the inductances. The testing method of a magnetic head comprises evaluating whether writing performance of the magnetic head is good or not, based on a relationship between the current values and the inductances.
申请公布号 US2009256557(A1) 申请公布日期 2009.10.15
申请号 US20080102569 申请日期 2008.04.14
申请人 TDK CORPORATION 发明人 KIYONO HIROSHI;MORI TAKAHIRO
分类号 G01R33/12;G11B5/39 主分类号 G01R33/12
代理机构 代理人
主权项
地址