发明名称 HIGH ASPECT RATIO OPENINGS
摘要 A capacitor forming method includes forming an electrically conductive support material over a substrate, with the support material containing at least 25 at% carbon. The method includes forming an opening through at least the support material where the opening has an aspect ratio of at least 20: 1 within a thickness of the support material. After forming the opening, the method includes processing the support material to effect a reduction in conductivity, and forming a capacitor structure in the opening.
申请公布号 WO2009126204(A2) 申请公布日期 2009.10.15
申请号 WO2009US01693 申请日期 2009.03.18
申请人 MICRON TESCHNOLOGY, INC.;KIEHLBAUCH, MARK, W. 发明人 KIEHLBAUCH, MARK, W.
分类号 H01L27/108;H01L21/3065;H01L21/8242;H01L27/04 主分类号 H01L27/108
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