发明名称 VOLTAGE MEASUREMENT APPARATUS, INTEGRATED CIRCUIT SUBSTRATE, AND VOLTAGE MEASUREMENT METHOD
摘要 <P>PROBLEM TO BE SOLVED: To provide a voltage measurement apparatus for suppressing an increase in a circuit area, and accurately measuring a voltage. Ž<P>SOLUTION: The voltage measurement apparatus includes: a comparison section 11 having a plurality of unit comparators 100 for comparing a measured voltage as an measuring object with an identical reference voltage, inputting respectively the identical standard voltage thereto, and each comparing the measured voltage with the reference voltage determined in response to the standard voltage; and an analysis section 13 for analyzing a comparison result from each unit comparator 100 including a fluctuation in a characteristic of circuit elements composing each unit comparator 100, and obtaining the measured voltage. Ž<P>COPYRIGHT: (C)2010,JPO&INPIT Ž
申请公布号 JP2009236627(A) 申请公布日期 2009.10.15
申请号 JP20080081781 申请日期 2008.03.26
申请人 TOKYO INSTITUTE OF TECHNOLOGY 发明人 SATO TAKASHI;UEZONO KO;EKI KAZUYA
分类号 G01R19/00 主分类号 G01R19/00
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