发明名称 ALIGNMENT APPARATUS FOR ALIGNING MULTI-LAYER STRUCTURES
摘要 An exemplary alignment apparatus can align a first layer with a second layer. The first layer has a first alignment pattern. The second layer has a second alignment pattern. The alignment apparatus includes a supporting device for supporting the first layer and the second layer, a light pervious reference plate, and a viewing and adjusting mechanism. The light pervious reference plate has a first reference pattern spatially corresponding to the first alignment pattern on the first layer, and a second reference pattern spatially corresponding to the second alignment pattern on the second layer. The viewing and adjusting mechanism is adapted for assisting a human operator to align the first reference pattern with the first alignment pattern and the second reference pattern with the second alignment pattern.
申请公布号 US2009257036(A1) 申请公布日期 2009.10.15
申请号 US20090421712 申请日期 2009.04.10
申请人 HON HAI PRECISION INDUSTRY CO., LTD. 发明人 CHUANG HSIN-HUNG
分类号 G01B11/00;G03B27/42 主分类号 G01B11/00
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