| 摘要 |
PURPOSE: A probe block of an inspection device is provided to test a semiconductor device or a flat display device by applying an electric signal to a pad electrode or semiconductor device of the flat display device. CONSTITUTION: A probe block of an inspection device includes a block body(100), a plurality of fixing blocks(200a-200c), and a plurality of probes(300). A probe insertion slit is formed in the fixing blocks. The probes are inserted into the probe insertion slit and input and output the signal by contacting with the object. The fixing blocks are laminated on the block body. The positions of the probes combined in the fixing blocks are different. The probe includes a contact unit, a fixing unit, and a position control unit. The position control unit has the length according to the fixing block. |
