SEMICONDUCTOR MEMORY DEVICE HAVING TEST SIGNAL GENERATOR

摘要

PURPOSE: A semiconductor memory device having a test signal generation circuit is provided to obtain the gain of product cost by reducing the test time. CONSTITUTION: A semiconductor memory device having a test signal generation circuit includes the first test signal generation unit and the second test signal generation unit. The first test signal generation unit produces the first test signal in response to the test clear signal in the first mode selected according to the mode selection signal. The second test signal generation unit produces the redundancy cell test signal and the normal cell test signal in response to the test clear signal in the second mode selected according to the mode selection signal.