发明名称 BAD BLOCK IDENTIFYING METHOD FOR FLASH MEMORY, STORAGE SYSTEM, AND CONTROLLER THEREOF
摘要 A bad block identifying method for a flash memory, a storage system, and a controller thereof are provided. The bad block identifying method includes determining whether a programming error occurs in a block of the flash memory after the block is programmed and marking the block as a bad block when the programming error successively occurs in the block. Since the block is determined to be a bad block only when the programming error repeatedly occurs in the block, misjudgment of bad block in the flash memory can be avoided and accordingly the lifespan of the flash memory storage system can be prolonged.
申请公布号 US2009259896(A1) 申请公布日期 2009.10.15
申请号 US20080140090 申请日期 2008.06.16
申请人 PHISON ELECTRONICS CORP. 发明人 HSU CHIH-JEN;HUANG YI-HSIANG
分类号 G11C29/04;G06F11/22 主分类号 G11C29/04
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