发明名称 CIRCUIT AND METHOD FOR A GATE CONTROL CIRCUIT WITH REDUCED VOLTAGE STRESS
摘要 Circuit and method for a gate control output circuit having reduced voltage stress on the devices is disclosed. In a circuit of MOS transistors for supplying an output to control a transfer gate, the output having a high voltage level that exceeds a supply voltage, first and second clamping circuits are provided. The first clamping circuit ensures a voltage between the gate and the source/drain and drain/source of a PMOS transistor that couples a pumped voltage to the output does not exceed a predetermined voltage. The second clamping circuit ensures that the voltage between the gate of an NMOS transistor and the output which is coupled to the drain/source of the NMOS transistor does not exceed a predetermined amount. The clamping circuits prevent gate stress problems on the transistors by ensuring the voltages between the gates and the source/drain and drain/source terminals do not exceed predetermined voltages.
申请公布号 US2009256625(A1) 申请公布日期 2009.10.15
申请号 US20080103332D 申请日期 2008.04.15
申请人 JUNG TAE HYUNG 发明人 JUNG TAE HYUNG
分类号 G05F1/00 主分类号 G05F1/00
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