发明名称 ESD PROTECTION
摘要 <p>An electrostatic discharge protection structure (200) for an integrated circuit, the electrostatic discharge protection structure (200) comprising: a first silicon controlled rectifier structure (211) having a first triggering voltage, the first rectifier structure (211) being directly connected to an input (250) of the electrostatic discharge protection structure (200); a second silicon controlled rectifier structure (222) having a second triggering voltage lower than the first triggering voltage, the second rectifier structure (222) being connected to the input (250) via a resistor (221); and a secondary over-voltage protection unit (231) connected to the input (250) via the resistor (221).</p>
申请公布号 WO2009125312(A1) 申请公布日期 2009.10.15
申请号 WO2009IB51342 申请日期 2009.03.31
申请人 NXP B.V.;DARTHENAY, FREDERIC;SMEDES, TAEDE;JACQUET, SEBASTIEN 发明人 DARTHENAY, FREDERIC;SMEDES, TAEDE;JACQUET, SEBASTIEN
分类号 H01L27/02;H03K19/003 主分类号 H01L27/02
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