发明名称 SAMPLE TARGET USED IN MASS ANALYZING METHOD, ITS MANUFACTURING METHOD AND MASS ANALYZER USING SAMPLE TARGET
摘要 PROBLEM TO BE SOLVED: To provide a sample target which enhances the measuring sensitivity of a low-molecular compound and is able to ionize a substance with a high-molecular weight of above 30,000 in mass analysis enabling the ionization of a sample without using a matrix, its manufacturing method and a mass analyzer using the sample target. SOLUTION: The sample target is used for holding the sample when the sample is ionized by the irradiation with a laser beam to perform mass analysis and has a surface, which receives the irradiation with the laser beam and has a plurality of recessed parts repeatedly formed thereto, as a sample holding surface. The surface of the sample holding surface excepting a part of the inner surfaces of the recessed parts is covered with a metal and/or a semiconductor and a part uncovered with the metal and/or the semiconductor is present on the inner surfaces of the recessed parts. COPYRIGHT: (C)2010,JPO&INPIT
申请公布号 JP2009236489(A) 申请公布日期 2009.10.15
申请号 JP20080078976 申请日期 2008.03.25
申请人 KANAGAWA ACAD OF SCI & TECHNOL;OSAKA PREFECTURAL HOSPITAL ORGANIZATION 发明人 MASUDA HIDEKI;YAGISHITA TAKASHI;WADA YOSHINAO
分类号 G01N27/62;G01N27/64 主分类号 G01N27/62
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