| 摘要 |
PROBLEM TO BE SOLVED: To provide a device for measuring frequency characteristics without being affected by noise even in the case of high frequency region. SOLUTION: A generator 2 receives a command which generates sine wave by which frequency sweep is carried out to step-like at intervals of predetermined frequency from an analyzer 4, and supplies a measured signal to an object to be measured 3 by generating sine wave of indicated frequency, whenever frequency which should be generated by this command is indicated. The analyzer 4 measures and displays the frequency characteristics of the object to be measured 3, by FFT-analyzing the measured signal output from the object to be measured 3 for sine wave of each step of step-like frequency sweep. COPYRIGHT: (C)2010,JPO&INPIT
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