| 摘要 |
<P>PROBLEM TO BE SOLVED: To prevent damaging of a test device in a test process, by cutting off damaging due to separating in a transfer process, since a semiconductor element is not normally installed in an insert. Ž<P>SOLUTION: An opening device of the insert 500 for a test tray provided with a support part 517 for supporting the semiconductor element installed in a storage part by forming the storage part 511 for storing the semiconductor element, includes a body, an opening means 120 arranged in the body and opening the insert, and a fixed position guide part 130 projectingly formed so as to be inserted inside the storage part when opening the insert and supporting the semiconductor element transferred to the storage part so as to separate to the upper side from the support part. Thus, the semiconductor element is lowered in a state of supporting the semiconductor element transferred to the storage part of the insert so as to separate to the upper side from the support part being the final safely landing point, and is guided so as to normally safely land on a determined position on the support part. Ž<P>COPYRIGHT: (C)2010,JPO&INPIT Ž
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