发明名称 Structure and method for surface-passivated zinc-oxide based sensor
摘要 <p>A semiconductor device has a heterostructure including a first layer (14) of semiconductor oxide material. A second layer (16) of semiconductor oxide material is formed on the first layer (14) of semiconductor oxide material such that a two dimensional electron gas builds up at an interface between the first and second materials. A passivation layer (18) on the outer surface stabilizes the structure. The device also has a source contact (20) and a drain contact (22). </p>
申请公布号 EP1801886(A3) 申请公布日期 2009.10.14
申请号 EP20060126150 申请日期 2006.12.14
申请人 PALO ALTO RESEARCH CENTER INCORPORATED 发明人 VANDEWALLE, CHRISTIAN G.;KIESEL, PETER;SCHMIDT, OLIVER
分类号 H01L29/778;G01N27/414;H01L29/22 主分类号 H01L29/778
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