发明名称 Shear-layer chuck for lithographic apparatus.
摘要 A lithographic apparatus is described that comprises a support structure to hold an object. The object may be a patterning device or a substrate to be exposed. The support structure comprises a chuck, on which the object is supported, and an array of shear-compliant elongated elements normal to the chuck and the stage, such that first ends of the elongated elements contact a surface of the chuck and second ends of the elongated elements contact a stage. Through using the array of elongated elements, a transfer of stress between the stage and the chuck is substantially uniform, resulting in minimization of slippage of the object relative to the surface of the chuck during a deformation of the chuck due to the stress.
申请公布号 NL1036735(A1) 申请公布日期 2009.10.13
申请号 NL20091036735 申请日期 2009.03.19
申请人 ASML HOLDING N.V. 发明人 SAMIR A. NAYFEH;MARK EDD WILLIAMS;JUSTIN MATTHEW VERDIRAME
分类号 H01L21/68;G03F7/20 主分类号 H01L21/68
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