发明名称 Semiconductor memory device having charge storage layer and method of manufacturing the same
摘要 The semiconductor memory device according to the present invention includes a charge storage layer 26 formed over a semiconductor substrate 10 and including a plurality of particles 16 as charge storage bodies in insulating films 12, 24, and a gate electrode 30 formed over the charge storage layer 26, in which the particles 16 are formed of metal oxide or metal nitride.
申请公布号 US7602011(B2) 申请公布日期 2009.10.13
申请号 US20070802815 申请日期 2007.05.25
申请人 FUJITSU MICROELECTRONICS LIMITED 发明人 SUGIZAKI TARO
分类号 H01L29/792;H01L29/788 主分类号 H01L29/792
代理机构 代理人
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