| 摘要 |
An apparatus for testing electric components supported on a test plate for transport along a travel path through a test station includes an electrical contactor at the station for contacting the plate surface and at least one electronic component transported to the station by the plate for testing. An adjustable force applicator supplies contact pressure to the contactor to apply a substantially constant force over a large working travel range. The applicator can include an air cylinder having a force applying pin applying force to a position located between a working point of the contactor and the pivot point such that the applied force variation is reduced as a result of a lever reduction ratio between the working point and the pin position.
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