| 摘要 |
PROBLEM TO BE SOLVED: To provide an optical device defect inspection method and an optical device defect inspecting apparatus which is not affected by the difference in curvature or the position of an optical device, and which is high-speed and is low cost. SOLUTION: The focus of a photographic means 3 is aligned with a lens under inspection 2, and a light source 5 is moved away from the lens under inspection 2, to a position at which a density difference in a dot pattern 8 within an image of the lens under inspection 2 photographed by the photographic means 3 disappears, thereby defects in the lens under inspection 2 are detected, through image distortion 11 produced inside the image which does not have density difference. COPYRIGHT: (C)2010,JPO&INPIT |
