发明名称 ABNORMALITY IDENTIFYING METHOD, ANALYZING APPARATUS, AND REAGENT
摘要 An abnormality identifying method is for identifying an abnormality detail in an analyzing apparatus that analyzes a specimen based on optical measurement. The method includes: for a reagent having a same function as an intermediate product produced during analysis processes, canceling a predetermined analysis process other than an analysis process to be verified for abnormality from among analysis processes with respect to the specimen; and identifying an abnormality in the analyzing apparatus based on a measurement result obtained by performing a same analysis process as an analysis process performed on the intermediate product as well as the analysis process to be verified for abnormality.
申请公布号 US2009254309(A1) 申请公布日期 2009.10.08
申请号 US20090422546 申请日期 2009.04.13
申请人 OLYMPUS CORPORATION 发明人 KUBOTA KIYOTAKA;FURUSAWA YUKIHIRO;FUJIMORI KOJI
分类号 G06F15/00;G01N33/543 主分类号 G06F15/00
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