发明名称 MEMORY CIRCUITS WITH REDUCED LEAKAGE POWER AND DESIGN STRUCTURES FOR SAME
摘要 A memory circuit includes a global read bit line, a global read bit line latch, and a plurality of sub-arrays, each of which includes first and second local read bit lines, first and second local write bit lines, and first and second pluralities of memory cells interconnected, respectively, with the first and second local read bit lines and the first and second local write bit lines. The local read bit lines are decoupled from the local write bit lines. A local multiplexing block is interconnected with the first and second local read bit lines and is configured to ground the first and second local read bit lines upon assertion of a SLEEP signal, and to selectively interconnect the local read bit lines to the global read bit line. A global multiplexing block is interconnected with the global read bit line and is configured to maintain the global read bit line in a substantially discharged state upon assertion of the SLEEP signal and to interconnect the global read bit line to the global read bit line latch. Also included are design structures for circuits of the kind described.
申请公布号 US2009251974(A1) 申请公布日期 2009.10.08
申请号 US20080098764 申请日期 2008.04.07
申请人 INTERNATIONAL BUSINESS MACHINES CORPORATION 发明人 CHU SAM GAT-SHANG;ISLAM SAIFUL;KIM JAE-JOON;KOSONOCKY STEPHEN V.
分类号 G11C7/12;G11C5/14 主分类号 G11C7/12
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