发明名称 Scanning von hamos type x-ray spectrometer
摘要 An X-ray spectrometer that collects a very large solid angle of emitted X-rays from a sample but "views" only a narrow portion of the X-rays at a time. The invention uses a moving detector, which moves along the optical axis, to count or collect X-rays from within narrow wavelength regions.
申请公布号 US2009252294(A1) 申请公布日期 2009.10.08
申请号 US20090384010 申请日期 2009.03.31
申请人 O'HARA DAVID 发明人 O'HARA DAVID
分类号 G01N23/20 主分类号 G01N23/20
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