发明名称 |
DEFECT CORRECTION DEVICE, DEFECT CORRECTION METHOD AND METHOD FOR MANUFACTURING PATTERNED SUBSTRATE |
摘要 |
<P>PROBLEM TO BE SOLVED: To provide a defect correction device and method for reliably correcting a defect, and also to provide a method for manufacturing a patterned substrate. <P>SOLUTION: The defect correction device is equipped with: correction optics 20 for irradiating a defective part of a sample with a laser beam through an objective lens 43; and illumination optics 50 for irradiating and illuminating the sample with a laser beam at the same wavelength as the above laser beam through the objective lens 43 to observe the sample 70, wherein the illumination optics 50 has a homogenizing part 65 for homogenizing the spatial distribution of a laser beam. <P>COPYRIGHT: (C)2010,JPO&INPIT |
申请公布号 |
JP2009230020(A) |
申请公布日期 |
2009.10.08 |
申请号 |
JP20080077891 |
申请日期 |
2008.03.25 |
申请人 |
LASERTEC CORP |
发明人 |
KUSUSE HARUHIKO;TAKEHISA KIWAMU;MIFUKU HIDEFUMI |
分类号 |
B23K26/00;G02B5/20;G02F1/13;G03F1/72;H01L21/027 |
主分类号 |
B23K26/00 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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