发明名称 DEFECT CORRECTION DEVICE, DEFECT CORRECTION METHOD AND METHOD FOR MANUFACTURING PATTERNED SUBSTRATE
摘要 <P>PROBLEM TO BE SOLVED: To provide a defect correction device and method for reliably correcting a defect, and also to provide a method for manufacturing a patterned substrate. <P>SOLUTION: The defect correction device is equipped with: correction optics 20 for irradiating a defective part of a sample with a laser beam through an objective lens 43; and illumination optics 50 for irradiating and illuminating the sample with a laser beam at the same wavelength as the above laser beam through the objective lens 43 to observe the sample 70, wherein the illumination optics 50 has a homogenizing part 65 for homogenizing the spatial distribution of a laser beam. <P>COPYRIGHT: (C)2010,JPO&INPIT
申请公布号 JP2009230020(A) 申请公布日期 2009.10.08
申请号 JP20080077891 申请日期 2008.03.25
申请人 LASERTEC CORP 发明人 KUSUSE HARUHIKO;TAKEHISA KIWAMU;MIFUKU HIDEFUMI
分类号 B23K26/00;G02B5/20;G02F1/13;G03F1/72;H01L21/027 主分类号 B23K26/00
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