发明名称 SEMICONDUCTOR INTEGRATED CIRCUIT FOR CHARGING CONTROL
摘要 PROBLEM TO BE SOLVED: To provide an IC for charging control which is so easily to be adjusted by enabling to adjust a plurality of set values in a desired direction only by changing one point in a circuit when desiring a change in a set temperature of shut down and a temperature range for current control, and requires a small increase in chip size. SOLUTION: The IC for charging includes a temperature detection circuit (13) having a temperature detection element and generating a voltage corresponding to the temperature of a chip, and has functions for setting thresholds for the set temperature of shutdown and the temperature range for current control and controlling a charging current. In the IC, a current mirror circuit for changing a mirror ratio is provided between a bias circuit (BIAS) for generating a predetermined bias voltage and a current source (CS) for applying a current to a temperature detection element (SNS). With this configuration, the mirror ratio of the current mirror circuit is changed to change a current to be applied for the temperature detection element, and thus the threshold values for the upper and lower limits of the set temperature of shutdown and the temperature range for current control are simultaneously adjusted. COPYRIGHT: (C)2010,JPO&INPIT
申请公布号 JP2009232550(A) 申请公布日期 2009.10.08
申请号 JP20080073787 申请日期 2008.03.21
申请人 MITSUMI ELECTRIC CO LTD 发明人 MATSUDA HIROKI;TAKESHITA JUNJI
分类号 H02J7/10;H01M10/44 主分类号 H02J7/10
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