发明名称 FOREIGN MATTER INSPECTION METHOD AND FOREIGN MATTER INSPECTION DEVICE
摘要 <P>PROBLEM TO BE SOLVED: To provide an image processing method for reducing erroneous detection of a foreign matter caused by non-uniform lighting and refraction of irradiation light upon inspection of a non transparent foreign matter in a transparent container filled with a liquid. Ž<P>SOLUTION: A pseudo reference image is obtained by a noise image reduction processing such as a smoothing processing on an original image of the container to be inspected. A brightness difference from the original image is determined using the brightness of the reference image as a standard, and a differential image is formed. By inspecting the differential image, it is possible to eliminate influence of brightness variations in the image caused by non-uniform lighting and refraction of irradiation light and thereby to reduce erroneous detection. Ž<P>COPYRIGHT: (C)2010,JPO&INPIT Ž
申请公布号 JP2009229200(A) 申请公布日期 2009.10.08
申请号 JP20080074073 申请日期 2008.03.21
申请人 HITACHI PLANT TECHNOLOGIES LTD 发明人 WADA TAKESHI
分类号 G01N21/90 主分类号 G01N21/90
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