| 摘要 |
<p><P>PROBLEM TO BE SOLVED: To provide an inspection chip producing method capable of detecting a specimen with high sensitivity. <P>SOLUTION: The method includes a microstructure producing step of producing a microstructure where metallic portions having dimensions permitting excitation of localized plasmons are formed and distributed on one surface of a substrate, a specimen attaching step of attaching the specimen to the surfaces of the metallic portions of the microstructure, and a metallic particle attaching step of attaching metallic particles having dimensions permitting excitation of localized plasmons to the metallic portions and the specimen, wherein a substance capable of specifically binding to the specimen is not fixed to at least either the metallic portions or the metallic particles. <P>COPYRIGHT: (C)2010,JPO&INPIT</p> |
