发明名称 MODEL INSPECTING DEVICE
摘要 <P>PROBLEM TO BE SOLVED: To provide a model inspecting device for improving the efficiency of model inspection. Ž<P>SOLUTION: The model inspecting device is provided with: a model information storing means for storing a class representing a process structure, a state machine representing a state transition of the class and model information representing a system model; an inspection target model setting means for receiving the selection of a specific state machine among machines associable with the class stored in the model information storing means and setting an inspection target model obtained by combining the selected specific state machine and the class; an inspection executing means for executing inspection as to whether inspection target model information representing the set inspection target model satisfies a predetermined inspection expression; and an inspection result outputting means for outputting the inspection target model information and an inspection result of the inspection target model by the inspection executing means. Ž<P>COPYRIGHT: (C)2010,JPO&INPIT Ž
申请公布号 JP2009223711(A) 申请公布日期 2009.10.01
申请号 JP20080068709 申请日期 2008.03.18
申请人 NEC CORP 发明人 SAEKI TAKEYUKI
分类号 G06F17/50 主分类号 G06F17/50
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