发明名称 METHOD AND APPARATUS FOR DETECTING DEFECTS USING STRUCTURED LIGHT
摘要 An improved method and apparatus for detecting problems with fit and finish of manufactured articles is presented which uses structured light. Two or more structured light images acquired from opposing directions is used to measure the fit of mating surfaces while avoiding false positives caused by small defects near the seam.
申请公布号 US2009245614(A1) 申请公布日期 2009.10.01
申请号 US20080055052 申请日期 2008.03.25
申请人 发明人 BALDWIN LEO;EMERY JOSEPH J.
分类号 G06K9/03 主分类号 G06K9/03
代理机构 代理人
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