| 摘要 |
<p><P>PROBLEM TO BE SOLVED: To provide a flip-flop circuit for scanning operated at higher speed by suppressing increase of a delay time, and to provide an integrated circuit scanning method which uses the flip-flop circuit for scanning. <P>SOLUTION: Only one transfer circuit is arranged between an inverter circuit for data signal input and an inverter circuit, in a master latch circuit part for inputting a signal from the inverter circuit for data signal input. One more transfer circuit forming a pair with the transfer circuit and operated added exclusively, rather than the master latch circuit part. <P>COPYRIGHT: (C)2010,JPO&INPIT</p> |
