发明名称 PLASMA PROCESSING APPARATUS, CHAMBER INTERNAL PART, AND METHOD OF DETECTING LONGEVITY OF CHAMBER INTERNAL PART
摘要 A plasma processing apparatus that can accurately detect the longevity of a chamber internal part to eliminate the waste of the replacement of the chamber internal part that has not reached its end of longevity and prevent the occurrence of troubles caused by continuously using the chamber internal part that has reached its end of longevity. In the chamber internal part, at least one longevity detecting elemental layer comprised of an element different from a constituent material of the chamber internal part is buried.
申请公布号 US2009246406(A1) 申请公布日期 2009.10.01
申请号 US20090412039 申请日期 2009.03.26
申请人 TOKYO ELECTRON LIMITED 发明人 NAKAYAMA HIROYUKI;MORIYA TSUYOSHI
分类号 H05H1/24;C23C16/00 主分类号 H05H1/24
代理机构 代理人
主权项
地址