发明名称 Schottky Barrier Diode and Method for Using the Same
摘要 An intermediate metal film is formed between a Schottky electrode and a pad electrode. A Schottky barrier height between the intermediate metal film and a silicon carbide epitaxial film is equivalent to or higher than a Schottky barrier height between the Schottky electrode and the silicon carbide epitaxial film. By this configuration, an excess current and a leak current through a pin-hole can be suppressed even in the case in which a Schottky barrier height between the pad electrode and the silicon carbide epitaxial film is less than the Schottky barrier height between the Schottky electrode and the silicon carbide epitaxial film.
申请公布号 US2009243026(A1) 申请公布日期 2009.10.01
申请号 US20060094922 申请日期 2006.11.22
申请人 CENTRAL RESEARCH INSTITUTE OF ELECTRIC POWER INDUSTRY 发明人 NAKAMURA TOMONORI;TSUCHIDA HIDEKAZU;MIYANAGI TOSHIYUKI
分类号 H01L29/872 主分类号 H01L29/872
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