| 摘要 |
A radiological measurement system protecting an amplifier from damage caused by a surge current, ensuring temporal continuity of measurement with a minimum dead time, and including a high voltage DC supply for applying a bias voltage to a radiation detector formed of semiconductor crystal, a controller for exercising on-off control on the bias voltage supplied from the high voltage DC supply, an amplifier, a protection circuit for protecting the amplifier from a surge current generated when the bias voltage is subjected to the on-off control, a control unit for preventing the surge current from flowing to the amplifier, and a switch provided in parallel with the protection circuit and controlled in operation state by the control unit, wherein the control unit controls the operation state of the switch in synchronism with the on-off control exercised by the control unit to prevent the surge current from flowing to the amplifier.
|
