METHOD FOR INSPECTING ELECTRONIC BOARDS USING MULTISPECTRAL ANALYSIS

摘要

The invention relates to a method for inspecting electronic boards, including the following steps: an electronic board (8) is exposed successively to radiation emissions of different wavelengths (?1, ?2, ?3, ?4); reflected images (4) of the electronic board are established for the successive radiation emissions; the images (4) are sub-divided into analysis zones (5) and said analysis zones are assigned reflected radiation values; a signature is produced for each analysis zone (5) by associating each analysis zone with the corresponding reflected radiation values obtained for the successive radiation emissions; and the signatures are compared to reference signatures.