发明名称 |
METHOD OF MANUFACTURING SEMICONDUCTOR DEVICE |
摘要 |
PURPOSE: A method of manufacturing a semiconductor device is provided to prevent distribution of boron due to long thermal treatment. CONSTITUTION: A method of manufacturing a semiconductor device is comprised of the steps: forming a gate(116) on a semiconductor substrate(100); forming a spacer on the both sidewall of the gate; forming a capping layer(122) on the gate and the semiconductor substrate including a spacer; forming the insulating layer(124) on the semiconductor substrate in which the gate is formed; and performing a thermal treatment of the insulating layer in a laser mode.
|
申请公布号 |
KR20090103498(A) |
申请公布日期 |
2009.10.01 |
申请号 |
KR20080029148 |
申请日期 |
2008.03.28 |
申请人 |
HYNIX SEMICONDUCTOR INC. |
发明人 |
KIM, JAE SOO;PARK, CHEOL HWAN;CHO, HO JIN |
分类号 |
H01L21/31;H01L21/268;H01L21/324 |
主分类号 |
H01L21/31 |
代理机构 |
|
代理人 |
|
主权项 |
|
地址 |
|