发明名称 METHOD OF MANUFACTURING SEMICONDUCTOR DEVICE
摘要 PURPOSE: A method of manufacturing a semiconductor device is provided to prevent distribution of boron due to long thermal treatment. CONSTITUTION: A method of manufacturing a semiconductor device is comprised of the steps: forming a gate(116) on a semiconductor substrate(100); forming a spacer on the both sidewall of the gate; forming a capping layer(122) on the gate and the semiconductor substrate including a spacer; forming the insulating layer(124) on the semiconductor substrate in which the gate is formed; and performing a thermal treatment of the insulating layer in a laser mode.
申请公布号 KR20090103498(A) 申请公布日期 2009.10.01
申请号 KR20080029148 申请日期 2008.03.28
申请人 HYNIX SEMICONDUCTOR INC. 发明人 KIM, JAE SOO;PARK, CHEOL HWAN;CHO, HO JIN
分类号 H01L21/31;H01L21/268;H01L21/324 主分类号 H01L21/31
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