发明名称 |
DIODE AND METHOD OF MANUFACTURING THE SAME |
摘要 |
PROBLEM TO BE SOLVED: To provide a technology for reducing a forward voltage drop across a diode having both p-type semiconductor regions and an n-type semiconductor region at a surface layer portion of a semiconductor layer. SOLUTION: The semiconductor layer 3 having a plurality of grooves 2 formed on a surface 6a has the p-type semiconductor regions 40, the n-type semiconductor region 30 formed in a region enclosing the p-type semiconductor region, and an n<SP>+</SP>-type cathode region 20. The p-type semiconductor regions 40 are exposed on bottom surfaces 6c of the grooves 2. Ohmic electrodes 51 are formed within ranges of the bottom surfaces 6c of the grooves 2 to form ohmic junctions J1 with the p-type semiconductor regions 40. A Schottky electrode 53 is formed in an exposure range on a top surface side including side surfaces 6 of the grooves 2 to form a Schottky junction J2 with the n-type semiconductor region 30. A cathode electrode 10 is formed in an exposure range on a reverse surface side of the cathode region 20 to form an ohmic junction J1 with the cathode region 20. COPYRIGHT: (C)2010,JPO&INPIT |
申请公布号 |
JP2009224485(A) |
申请公布日期 |
2009.10.01 |
申请号 |
JP20080066138 |
申请日期 |
2008.03.14 |
申请人 |
TOYOTA CENTRAL R&D LABS INC;DENSO CORP;TOYOTA MOTOR CORP |
发明人 |
WATANABE YUKIHIKO;KATSUNO TAKASHI;ISHIKO MASAYASU;ENDO TAKESHI;YAMAMOTO TAKEO;KONISHI MASAKI;FUJIWARA HIROKAZU |
分类号 |
H01L29/47;H01L21/329;H01L29/861;H01L29/872 |
主分类号 |
H01L29/47 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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