发明名称 DIODE AND METHOD OF MANUFACTURING THE SAME
摘要 PROBLEM TO BE SOLVED: To provide a technology for reducing a forward voltage drop across a diode having both p-type semiconductor regions and an n-type semiconductor region at a surface layer portion of a semiconductor layer. SOLUTION: The semiconductor layer 3 having a plurality of grooves 2 formed on a surface 6a has the p-type semiconductor regions 40, the n-type semiconductor region 30 formed in a region enclosing the p-type semiconductor region, and an n<SP>+</SP>-type cathode region 20. The p-type semiconductor regions 40 are exposed on bottom surfaces 6c of the grooves 2. Ohmic electrodes 51 are formed within ranges of the bottom surfaces 6c of the grooves 2 to form ohmic junctions J1 with the p-type semiconductor regions 40. A Schottky electrode 53 is formed in an exposure range on a top surface side including side surfaces 6 of the grooves 2 to form a Schottky junction J2 with the n-type semiconductor region 30. A cathode electrode 10 is formed in an exposure range on a reverse surface side of the cathode region 20 to form an ohmic junction J1 with the cathode region 20. COPYRIGHT: (C)2010,JPO&INPIT
申请公布号 JP2009224485(A) 申请公布日期 2009.10.01
申请号 JP20080066138 申请日期 2008.03.14
申请人 TOYOTA CENTRAL R&D LABS INC;DENSO CORP;TOYOTA MOTOR CORP 发明人 WATANABE YUKIHIKO;KATSUNO TAKASHI;ISHIKO MASAYASU;ENDO TAKESHI;YAMAMOTO TAKEO;KONISHI MASAKI;FUJIWARA HIROKAZU
分类号 H01L29/47;H01L21/329;H01L29/861;H01L29/872 主分类号 H01L29/47
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