发明名称 AUTOMATIC ANALYZER
摘要 <P>PROBLEM TO BE SOLVED: To solve a problem wherein there are the possibility that a material other than an analyte, which is represented by a material contained in a system reagent for example, emits light and the possibility that the material disturbs the transmission of light, and an appropriate maintenance is required to be performed at a suitable time in order to improve the detection accuracy. Ž<P>SOLUTION: The light emission amount obtained in a reaction process or the transmission amount of light to the material obtained in the reaction process are measured, analysis results are verified based on the measured value of multi-dimensional arrangement consisting of a plurality of items and a plurality of pieces obtained by measurement. The automatic analyzer has a function of storing the transition of the measured value obtained during the analysis, estimating a time when the measured value exceeds a predetermined value based on the trend of the variation, and providing the appropriate maintenance time, and a function of providing the appropriate maintenance contents based on the transition of the measured value. Ž<P>COPYRIGHT: (C)2010,JPO&INPIT Ž
申请公布号 JP2009222610(A) 申请公布日期 2009.10.01
申请号 JP20080068657 申请日期 2008.03.18
申请人 HITACHI HIGH-TECHNOLOGIES CORP 发明人 SASAKI TAKAHIRO;SAKAZUME TAKU
分类号 G01N35/00 主分类号 G01N35/00
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