发明名称 STAGE, AND ELECTRON MICROSCOPE DEVICE
摘要 PROBLEM TO BE SOLVED: To provide a stage mechanism in which a drift is small while being stopped, and to provide an electron microscope provided with the mechanism. SOLUTION: A test-piece stage is provided with a plurality of driving elements which can conduct an expansion and contraction or a rocking and in which a stage can be shifted by co-working of the above two driving elements. In the stage mechanism, by the co-working of the above driving elements, various kinds of controls can be done by combining workings of the above two driving elements, and as a result, not only a shift of the stage but also a control of a drift while being stopped are made possible. COPYRIGHT: (C)2010,JPO&INPIT
申请公布号 JP2009224234(A) 申请公布日期 2009.10.01
申请号 JP20080068660 申请日期 2008.03.18
申请人 HITACHI HIGH-TECHNOLOGIES CORP 发明人 SEYA HIDEKAZU;NAGAMATSU TAKASHI
分类号 H01J37/20;G01B15/00;H01L21/027;H01L21/68 主分类号 H01J37/20
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