发明名称 SEMICONDUCTOR DEVICE
摘要 A device includes a measurement target circuit including a first circuit, a switch provided to a measurement node of the first circuit and a second circuit connected to the measurement node of the first circuit through the switch; and a current measuring circuit including a reference current source group connected to the measurement node through the switch and making a reference current of a predetermined value flow into the first circuit, a sample hold circuit connected to the measurement node, and sampling and holding the potential of the measurement node when the first circuit is connected to the second circuit by the switch, and a comparator connected to the measurement node and an output of the sample hold circuit and comparing an output of the sample hold circuit with the potential of the measurement node when the first circuit is connected to the reference current source group by the switch.
申请公布号 US2009243588(A1) 申请公布日期 2009.10.01
申请号 US20090405735 申请日期 2009.03.17
申请人 FUJITSU MICROELECTRONICS LIMITED 发明人 OKADA HIROKAZU
分类号 G01R19/00 主分类号 G01R19/00
代理机构 代理人
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