Reducing Noise In Atomic Force Microscopy Measurements

摘要

Exchanging data between an Atomic Force Microscopy (AFM) measuring device and an external controlling device using a wireless link. The wireless link replaces cables leading to the AFM measuring device and thereby mitigates mechanical noise vibrations. The controlling device can be an AFM controller, a PC workstation, a keyboard or a pointing device. A power supply and cables to provide power to the measuring device can be replaced with a battery power source to further mitigate mechanical noise. The AFM measuring device can reside in a vibration isolation chamber along with the power source and AFM controller to further isolate noise.