发明名称 AUTOMATIC ANALYZER
摘要 <P>PROBLEM TO BE SOLVED: To improve a management work for comparing an ordinary measuring item with measurement results of a management specimen, namely, an accuracy management work flow by an inspection engineer, which often becomes inefficient in present device operation; to easily achieve a statistical accuracy management work which has been difficult hitherto in the comparison work; and to thereby contribute to reliability improvement of the accuracy management work. Ž<P>SOLUTION: In order to apply this invention, an application software for controlling an operation screen of an automatic analyzer is improved, and the specific number of management specimen measurement results are displayed simultaneously with the measurement results of the ordinary measuring item. Ž<P>COPYRIGHT: (C)2010,JPO&INPIT Ž
申请公布号 JP2009222451(A) 申请公布日期 2009.10.01
申请号 JP20080065069 申请日期 2008.03.14
申请人 HITACHI HIGH-TECHNOLOGIES CORP 发明人 ISHIZAWA MASAHITO;IMAI KYOKO
分类号 G01N35/00 主分类号 G01N35/00
代理机构 代理人
主权项
地址