发明名称 ELECTRO-OPTICAL DEVICE, METHOD OF INSPECTING ELECTRO-OPTICAL DEVICE, AND ELECTRONIC EQUIPMENT
摘要 PROBLEM TO BE SOLVED: To improve precision of inspection of a mounting defect and to shorten the time of inspection. SOLUTION: An electro-optical device 100 includes an electro-optical panel 110 having a plurality of first terminals and a plurality of second terminals, a circuit device 120 mounted on the electro-optical panel and having a plurality of circuit-side terminals electrically connected to each of the plurality of first terminals, and a wiring board 130 mounted on the electro-optical panel and having substrate-side terminals electrically connected to each of the plurality of second terminals, wherein the electro-optical device has a wiring pattern 140 for inspection, which has terminals 140g and 140h for inspection at both ends. The wiring pattern 140 for inspection is connected to an electric connection portion of one first terminal and one circuit-side terminal and an electric connection portion of one second terminal and one substrate-side terminal. COPYRIGHT: (C)2010,JPO&INPIT
申请公布号 JP2009223265(A) 申请公布日期 2009.10.01
申请号 JP20080070790 申请日期 2008.03.19
申请人 EPSON IMAGING DEVICES CORP 发明人 MURAYAMA HITOSHI
分类号 G09F9/00;G02F1/13;G02F1/1345 主分类号 G09F9/00
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