| 摘要 |
PROBLEM TO BE SOLVED: To measure a trace material with high sensitivity, by further improving the performance of an element used for detecting the trace material with high sensitivity, by using localized plasmon resonance. SOLUTION: This trace material detection element utilizing plasmon resonance has a substrate; a plurality of fine projection parts or fine pores formed on one surface of the substrate; and a metal layer formed on the upper surface of the projection parts and on the substrate surface, or a metal layer formed on a peripheral part and the bottom surface of the fine pores. In the trace material detection element, the metal layer formed on the upper surface of the projection parts is in a noncontact state with the metal layer formed on the substrate surface, or the metal layer formed on the peripheral part of the fine pores is in a noncontact state, with the metal layer being formed on the bottom surface of the fine pores. COPYRIGHT: (C)2010,JPO&INPIT |
