| 摘要 |
<P>PROBLEM TO BE SOLVED: To achieve a semiconductor-testing device capable of grasping fail information of each DUT when connecting one pin to a plurality of DUTs for testing. Ž<P>SOLUTION: In the semiconductor-testing device where a plurality of DUTs are connected to one pin, a comparison result register is provided for each DUT and fail information is selectively written to the comparison result register when the corresponding DUT is active. Ž<P>COPYRIGHT: (C)2010,JPO&INPIT Ž
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